Data for Novel Ir1–xCoxO2 thin films: growth and characterization

[Ir1–xCoxO2 thin films were prepared by reactive magnetron co–sputtering deposition on Si substrates at room temperature (RT) from metallic Ir and Co targets. Crystal structures were characterized by powder X-ray diffraction (XRD) at room temperature in a Rigaku D-Max system using Cu Kalpha wavelength. The resistivity measurements were carried out in a PPMS-9T. The magnetic measurements were carried out in a SQUID magnetometer MPMS–XL (both from Quantum Design). Transmission electron microscopy images, HRTEM (High resolution transmission electron microscopy) and STEM-HAADF (scanning TEM with high angular annular dark field detector), were performed by Tecnai F30 and Titan G2 80-300 keV (with aberration corrected probe), respectively, operated at 300 keV. The compositional analysis profile was performed by energy dispersive spectroscopy (EDS) in an Oxford Aztec equipment in situ STEM-HAADF analysis. The lamellae for TEM analysis were prepared by focused ion beam in a commertial Helios 650 N dual beam equipment. X–ray absorption spectroscopy (XAS) measurements were carried out at the B18 beamline of the Diamond Light Source. Co K-edge and Ir L2,3-edge XAS spectra of the films were measured in fluorescence mode using Quick-EXAFS technique. A Si (111) double crystal monochromator was used to select the incident X-ray energy. Co K-edge (Ir L3-edge) measurements have been performed using collimating mirror with Pt (Cr) coating. The fluorescence measurements have been performed using Canberra 36-pixel Monolithic Segmented Hyper Pure Germanium Detector with the STFC Xspress4 Digital Pulse Processor.]