XPS O1S peak for chromium oxide coating
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Scienta ESCA 300 spectrophotometer equipped with a monochromatic Al Kα (1486.6 ev) x-ray source were utilised for the measurements. The obtained XPS data was analysed with CasaXPS software, Shirkley method was used for the background subtraction and the binding energy calibration was implemented by using the C1s peak taking it as 285eV.
创建时间:
2017-06-16



