supplementary Material

See the supplementary material for the surface and cross-sectional SEM images, relative density and grain size statistics (FIG. S1), Rietveld refinement results (FIG. S2), enlarged out-of-plane PFM phase images for x = 0.050 (FIG. S3), Tm as a function of x (FIG. S4), fitting of γ and γ as a function of x (FIG. S5), Weibull distributions of Eb (FIG. S6), comparison of Wrec and η values of x = 0.125 ceramics with some recently reported ceramic systems) (FIG. S7), XPS O 1s spectra and the corresponding fitting of oxygen vacancy concentration (FIG. S8), refined structural parameters (TABLE S1), and comparison in the temperature stability of the x = 0.125 sample with some recently reported ceramic systems (TABLE S2).

请参阅补充材料中的表面和横截面扫描电子显微镜图像、相对密度和晶粒尺寸统计数据（图S1）、Rietveld精修结果（图S2）、x = 0.050处的扩展平面光磁成像相位图像（图S3）、Tm随x的变化（图S4）、γ和γ随x的变化拟合（图S5）、Eb的威布尔分布（图S6）、x = 0.125陶瓷的Wrec和η值与一些近期报道的陶瓷系统的比较（图S7）、XPS O 1s光谱及其对应的氧空位浓度拟合（图S8）、精修的结构参数（表S1），以及x = 0.125样品与一些近期报道的陶瓷系统在温度稳定性方面的比较（表S2）。