Full Sun XUV Spectroscopy Imaging (SPIRIT)

The Full Sun XUV Spectroscopy Imaging Instrument (SPIRIT) onboard CORONAS-F uses X-ray and extreme UV imaging spectroscopy to study the dynamics of active Sun from high resolution X and XUV spectral images in the 1,85-304 Å band; the dynamics of non-stationary solar events - flares, jets, CME in time scale from ~1 sec to months; the fine structure of solar plasma in flares, active regions, coronal holes with T = 0,05-50 MK; and the Fe- and He-ions distribution in solar disk and corona up to 5 solar radii . The SIPIRT is comprised of two components: the Solar X-Ray Telescope (SRT) and the X-Ray Spectroheliograph (RES-K).

The SRT, measuring the spatial structure and dynamics of the upper solar atmosphere, includes three optical channels: VR1, VR2 and SP (VR - "High Resolution", SP - "Wide Angle”). The High Resolution Channel VR1 has a Ritchey-Chretien lense (France), 1024x1152 CCD matrix, spectrum bands: 171Å (FeIX-FeXI), 195 Å (FeXII), 284Å (FeXV), 304Å (HeII) , 42' x 42' view angle(full disk) with angular resolution 1".4 - 2".5/cell and exposition time 0.5 - 100 sec. The High Resolution Channel VR2 has two paraboloids, 1024x1152 CCD matrix, spectrum bands: 175Å and 304Å with angular resolution up to 1".8/cell, view angle 30' x 30' and exposition time 0.04 - 100 sec. The Wide Angle Channel SP has a Ritchey-Chretien lense, 1024x1152 CCD matrix, spectrum band: 304Å with angular resolution 8"/cell, view angle 2° x 2° (up to 3 RO).

The RES-K instrument is an X-ray spectroheliograph to provide high-resolution images of the solar disk using the emission lines of FeXXIV and FeXXV in the 18.5-18.7 nm, and the MgXII line in the 84.1-84.3 nm range. Images in the emission lines covering 1800-2050 nm and 2850-3350 nm will also be obtained by scanning the range in widths of 0.3 nm. The images will be at a spatial resolution of six arc-sec. Each full-disk image is to be produced in about six seconds.

CORONAS-F 卫星搭载的全日面 XUV 光谱成像仪（SPIRIT）通过 X 射线和极端紫外线成像光谱技术，对活跃太阳的动力学进行深入研究，具体包括从 1,85-304 Å 波段的高分辨率 X 射线和 XUV 光谱图像中分析活跃太阳的动态；对非静态太阳事件——如耀斑、喷流、日冕物质抛射等，在 1 秒至数月的时间尺度上进行研究；分析耀斑、活动区、日冕空洞中温度为 0.05-50 MK 的太阳等离子体的精细结构；以及研究太阳盘和日冕中 Fe-和 He-离子的分布，范围可达 5 个太阳半径。SPIRIT 由两部分组成：太阳 X 射线望远镜（SRT）和 X 射线分光日面仪（RES-K）。

SRT 用于测量上太阳大气层的空间结构和动力学，包含三个光学通道：VR1、VR2 和 SP（VR 代表“高分辨率”，SP 代表“宽视场”）。高分辨率通道 VR1 配备了法国制造的 Ritchey-Chretien 望远镜，1024x1152 像素 CCD 矩阵，光谱波段包括 171Å（FeIX-FeXI）、195 Å（FeXII）、284Å（FeXV）、304Å（HeII），视场角为 42' x 42'（全盘），角分辨率在 1".4 - 2".5/cell 之间，曝光时间为 0.5 - 100 秒。高分辨率通道 VR2 配备了两个抛物面，1024x1152 像素 CCD 矩阵，光谱波段为 175Å 和 304Å，角分辨率最高可达 1".8/cell，视场角为 30' x 30'，曝光时间为 0.04 - 100 秒。宽视场通道 SP 配备了 Ritchey-Chretien 望远镜，1024x1152 像素 CCD 矩阵，光谱波段为 304Å，角分辨率为 8"/cell，视场角为 2° x 2°（可达 3 RO）。

RES-K 仪器是一种 X 射线分光日面仪，旨在利用 FeXXIV 和 FeXXV 在 18.5-18.7 nm 以及 MgXII 在 84.1-84.3 nm 范围内的发射线，提供太阳盘的高分辨率图像。通过扫描 0.3 nm 的宽度范围，将获取覆盖 1800-2050 nm 和 2850-3350 nm 的发射线图像。图像的空间分辨率为六角秒。每个全盘图像将在大约六秒内生成。