IROC Technologies / Integrated Circuits SER tests
收藏Mendeley Data2024-01-31 更新2024-06-27 收录
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https://topcat.isis.stfc.ac.uk/doi/INVESTIGATION/115560924/
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资源简介：
Integrated Circuits will be tested at ChipIr beam line to reproduce errors induced by terrestrial radiation effects from fast neutrons. Radiation effects tests are part of the overall reliability of electronic components used in several market such as automotive, medical or networking.
创建时间：
2024-01-31
