BAM Reference Data: Creep of Single-Crystal Ni-Based Superalloy CMSX-6

This version replaces version 2.0 (March 2026). Changes included in this version are listed at the end of this text. This publication provides comprehensive metadata and test results of constant force creep tests according to DIN EN ISO 204:2019-4 on the single crystal Ni-based superalloy CMSX-6 at T = 980 °C and initial stresses between 140 MPa and 230 MPa. The tests were carried out in an ISO 17025-accredited testing laboratory. The calibrations of measuring equipment are documented, meet the requirements of the measurement standard, and are metrologically traceable. The data were audited and are BAM reference data. The publication of this reference dataset is part of the overarching framework for management of reference data presented in [1]. A data descriptor article accompanies this dataset publication [2]. Please consider citing these works [1,2] if you use the data for a scientific publication. The data can be useful for verifying one’s own creep test results on nominally similar material, for verifying one’s own test set-up (e.g., by testing the same or a similar material), and as input data for simulations of the creep behavior in mechanical design or alloy development. There are currently no known restrictions on the use of the data. The data are provided using v2.1 of the “NFDI-MatWerk/IUC02 Data schema for creep data of Ni-based superalloys including a comprehensive documentation of test results and metadata” [3] as a template for data documentation and structuring. The provided data fully meets the requirement profile (mandatory fields in the column “Requirement” of the data schema). The requirement profile was agreed upon by domain experts. An XLSX file “Vh5205_Creep-reference-data-CMSX-6_v2.1.xlsx”, *.lis files (ASCII format), JSON files, and further supplementary files (PDF, JPG, TIF) are provided. The XLSX file contains metadata and test results that are valid for the entire test campaign, as well as selected test results for the individual tests. Worksheets are named according to the respective test ID. Whether the information contained in an entry is common to all tests is documented with a * symbol in the last column “Information common to all (*)”. The metadata and test results, i.e., the responses to the individual fields of the data schema [3], are provided in the column labeled as “Information”. Selected responses refer to further files. Overall, all mandatory entries (see column “Requirement”) are provided. The usage that is intended for the data and defines the implemented requirement profile is described in [3]. Five types of *.lis files (ASCII format) are provided: Files “Vh5205_C-XY-MD-TR.LIS”, where XY corresponds to the respective test ID: The content of these files corresponds to the content of the individual worksheets of the XLSX file “Vh5205_Creep-reference-data-CMSX-6_v2.1.xlsx” containing metadata (MD) and test results (TR). Files of type “Vh5205_C-XY-Creep.LIS”, where XY corresponds to the respective test ID: These files contain a header with selected mandatory metadata and test results. Below the header, the mandatory data series that represents the material's creep response is provided. Files of type “Vh5205_C-XY-Loading.LIS”, where XY corresponds to the respective test ID: These files contain the mandatory data series corresponding to the loading phase. Files of type “Vh5205_Complementary_*.LIS”: Complementary files. In the XLSX file, selected responses refer to these files. Files “Vh5205_C-XY-MD-TR_translated.json”, where XY corresponds to the respective test ID: The content of each of these JSON files corresponds to the content of each datasheet in the XLSX file and of each file of type “Vh5205_C-XY-MD-TR.LIS”. The decimal point setting is based on the specifications of DIN EN ISO 204:2019-4 and the resolution of the measuring devices. The measurement uncertainty of test temperature (T), initial stress (Ro), and percentage plastic extension from end of loading (e) were determined according to “Measurement uncertainties in mechanical tests on metallic materials- Part 3 - CWA 15261-3:2005” and shown in Table 1. Table 1. Combined standard uncertainties (confidence level 68 %) for test temperature (T), initial stress (Ro), and percentage plastic extension from end of loading (e). ± uc % (T) [°C] ± uc % (Ro) [MPa] ± u % (e) [%] % % % Max. 0.30 0.67 1.0 Changes v2.0 Usage of the most recent version (2.0) of the data schema for creep data of Ni-based superalloys [3] in XLSX format. Microstructure and test piece location images provided as single image files. TIF files contain the metadata of the SEM measurements. In this version, not only the creep data series with a header containing selected metadata and test results, but also all further metadata and test results are provided in *.lis format. The header of the *.lis files containing the creep data was revised. Revision of the descriptive text, including a reference to the newly published data descriptor article [2]. The dataset includes now a reference to the newly published dataset “BAM Reference Data: High Temperature Tensile Data of Single-Crystal Ni-Based Superalloy CMSX-6 (1.0)” [4]. v2.1 Usage of the most recent version (2.1) of the data schema for creep data of Ni-based superalloys [3], including the JSON schema. For enhanced data handling, the worksheet “Common-to-all” in the XLSX file “2026-03_Creep-reference-data-CMSX-6_v2.0.xlsx” and the file “Vh5205_MD-TR_Common-to-all.LIS” were removed. Instead, each worksheet within the XLSX file, as well as each file of type “Vh5205_C-XY-MD-TR.LIS”, contains the complete information of the respective test. Whether the information contained in an entry is common to all tests is documented with a * symbol in the last column “Information common to all (*)”. The responses to the schema entries are now also provided in JSON format. The content of the JSON files corresponds to the datasheets in the XLSX file and the *.lis files. In the JSON files, the chemical composition is provided element-by-element. Textual references for supplementary files have been revised and corrected. References [1] L.A. Ávila Calderón, Y. Shakeel, A. Gedsun, M. Forti, S. Hunke, Y. Han, T. Hammerschmidt, R. Aversa, J. Olbricht, M. Chmielowski, R. Stotzka, E. Bitzek, T. Hickel, B. Skrotzki, Management of reference data in materials science and engineering exemplified for creep data of a single-crystalline Ni-based superalloy, Acta Materialia 286 (2025) 120735, DOI: 10.1016/j.actamat.2025.120735 [2] L. Ávila Calderón, S. Schriever, Y. Han, J. Olbricht, P.D. Portella, B. Skrotzki, Creep reference data of single-crystal Ni-based superalloy CMSX-6, Data in Brief 65 (2026) 112436, DOI: 10.1016/j.dib.2025.112436 [3] L. A. Ávila Calderón, Y. Shakeel, S. Schriever, A. Gedsun, M. Forti, H. Jordan, Y. Han, O. Baer, R. Aversa, J. Olbricht, T. Hammerschmidt, T. Hickel, & B. Skrotzki, NFDI-MatWerk/IUC02 Data schema for creep data of Ni-based superalloys including a comprehensive documentation of test results and metadata (2.0), Zenodo (2024), DOI: 10.5281/zenodo.17975526 [4] Ávila Calderón, L. A., Matzak, K., Olbricht, J., Dolabella Portella, P., & Skrotzki, B. (2025). BAM Reference Data: High Temperature Tensile Data of Single-Crystal Ni-Based Superalloy CMSX-6 (1.0) [Data set]. Zenodo. DOI: 10.5281/zenodo.17846617 Acknowledgment This work was carried out in the context of NFDI-MatWerk and partially funded by the Deutsche Forschungsgemeinschaft (DFG, German Research Foundation) under the National Research Data Infrastructure – NFDI 38/1 – project number 460247524. The purchase of the investigated material was funded as part of a DFG research project (reference Po 405/2-1). The authors acknowledge Mariano Forti from Ruhr Universität Bochum for continued discussions on data preparation for further usage, and Kathrin Matzak from BAM for providing the Rp0.2 values.