Quantifying Flat-Band Voltage in Si Metal-Oxide-Semiconductor Structures- An Evaluation via Terahertz Emission Spectroscopy (TES) dataset
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https://figshare.com/articles/dataset/Figure_2_opju/29043638
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资源简介：
The calculation dataset of Figure.2 in the titled journal paper: Quantifying Flat-Band Voltage in Si Metal-Oxide-Semiconductor Structures- An Evaluation via Terahertz Emission Spectroscopy (TES)
创建时间：
2025-05-13
