Electron backscatter diffraction data for epidote-rich sheared veins from the Bolfin Fault Zone (Atacama Fault System, Chile)

Electron backscatter diffraction was used on thin sections of two epidote-rich sheared veins and associated wall rocks from the Bolfin Fault Zone (Northern Chile), cut parallel to fault lineation and perpendicular to vein boundary. The dataset includes seven sample sets (.ctf), of six magmatic quartz grains in the wall rocks and one from a wall-rock fragment included in the veins. The data were collected using Tescan Solaris (Field Emission Gun – Scanning Electron Microscope; FEG-SEM) installed at the Department of Geosciences of University of Padova (Italy). The EBSD maps were acquired using the FEG-SEM equipped with a COMOS-Symmetry EBSD detector (AZtec acquisition software, Oxford Instruments), operating at 20 kV as accelerating voltage, 5-10 nA as beam current, 70° sample tilt and high vacuum. EBSD data were elaborated with the MTEX toolbox (https://mtex-toolbox.github.io/).