Soft errors caused by muons and neutrons at 20 nm technology node
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https://b2find.eudat.eu/dataset/3b27e818-3bc6-5e20-83ca-c98fe55bb09c
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Soft errors are expected to be the most dominant failure mechanism at 20 nm technology node. With the low critical charge requirements for an upset (~ 0.1 fC), SRAM cells and...
