Development of novel data analysis for DAFS data

Diffraction Anomalous Fine Structure (DAFS) is a technique that combines the short-range structural sensitivity of X-ray absorption spectroscopy with the long-range periodicity of X-ray diffraction, and can provide novel insight which is not available from these techniques alone or in combination. Ideally, multiple full diffraction patterns are collected as a function of incident X-ray energy across the absorption edge of one of the elements in the sample. However, the widespread use of this technique has been limited in part by time-consuming data collection, and in part by challenging data analysis. Here we want to collect DAFS data on the known mixed valence state materials, GaCl2 and Sb2O4 to test our novel way of analysing DAFS data, taking advantage of the new capabilities at ID22 and improvements in software and computing power.