Data underlying the publication: Device-Aware Test for Ion Depletion Defects in RRAMs
收藏DataCite Commons2025-03-17 更新2025-04-08 收录
下载链接：
https://data.4tu.nl/datasets/30c4cc38-5844-41f2-bdef-8fa36b800ec5/1
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资源简介：
The raw data of a defect-free RRAM I-V curve, which can be seen in Fig. 10 (a). The data set can help researcher to make an I-V curve or R-V curve of a HfO2 based RRAM device.
提供机构：
4TU.ResearchData
创建时间：
2025-03-17
