Data underlying the publication: Device-Aware Test for Ion Depletion Defects in RRAMs
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资源简介：
The raw data of a defect-free RRAM I-V curve, which can be seen in Fig. 10 (a). The data set can help researcher to make an I-V curve or R-V curve of a HfO2 based RRAM device.
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4TU.ResearchData创建时间：
2025-03-17
