Raw data supporting the article: Tailoring the adhesion properties of thin polymeric films using additives: an AFM study.

AFM image and peak force files supporting the article "Tailoring the adhesion properties of thin polymeric films: an AFM study". All data can be extracted from the peak force files, which are a collection of all force-distance curves for each pixel in the image. The images in the publication originate either from the AFM image data or are calculated from the peak force file, depending on the type of property presented. Figures showing topography and adhesion are collected from the image data. Figures showing adhesion energy and detachment are calculated from the peak force file.

本数据集包含支撑论文《调控聚合物薄膜的粘附性能：原子力显微镜研究》（"Tailoring the adhesion properties of thin polymeric films: an AFM study"）的原子力显微镜（Atomic Force Microscope，AFM）图像与峰值力文件。所有数据均可从峰值力文件中提取，此类文件存储了图像中每个像素对应的全部力-距离曲线集合。论文中使用的图像，根据所展示的物性类型不同，既可源自原始原子力显微镜图像数据，也可通过峰值力文件计算得到。展示形貌与粘附性能的图像均采集自原始原子力显微镜图像数据，而展示粘附能与脱附行为的图像则通过峰值力文件计算生成。