Raw data for "Multi-slice ptychography enables high-resolution in situ measurements in extended chemical reactors"
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Raw data used in "Multi-slice ptychography enables high-resolution in situ measurements in extended chemical reactors" by M. Kahnt, L. Grote, D. Brückner, M. Seyrich, F. Wittwer, D. Koziej and C.G. Schroer.
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Zenodo创建时间：
2020-08-10
