Neutron-Induced Upsets and Stuck Bits on COTS Pseudo-Static RAMs
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This is the raw data used for the poster presented at the NSREC2025 with the title of "Neutron-Induced Upsets and Stuck Bits on COTS Pseudo-Static RAMs".The tests have been run at the ENEA center, Itlay. Each subfolder contains the data for one of the used memories.
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Zenodo创建时间：
2025-06-25
