Si Indent EBSD patterns for Strain Analysis
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资源简介：
H5OINA EBSD Data for an indent on Silicon Reproducing experiment with conditions similar to Fig.6 in Wilkinson & Britton (2012): https://doi.org/10.1016/S1369-7021(12)70163-3 Pattern Resolution 622x512
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Zenodo创建时间：
2025-02-17
