Auger electron spectroscopy maps of Ga and In-intercalated O2/He plasma treated EG/SiC. C, Si, O, In, and Ga are mapped. Two samples are mapped: 181016A_Ga (Ga-intercalated) and 181104_In (In-intercal

Figshare2020-01-29 更新70

24-COLOR ASTEROID SURVEY

行星与小行星光谱探测

天体表面成分分析

This dataset is comprised of asteroid flux data measured in 26 filters using the McCord dual beam photometer, and covering the range 0.32 - 1.08 microns for 285 numbered...

NASA Open Data Portal30

MER1 APXS Raw Data Bundle

天体表面成分分析

行星地质探测

This bundle contains raw data from the Alpha Particle X-ray Spectrometer on Mars Exploration Rover 1 (Opportunity).

NASA Open Data Portal20