Nanofiber SEM Dataset

This study presents a deep learning-based framework for automated defect detection in electrospun Polyacrylonitrile (PAN) nanofibers using Scanning Electron Microscope (SEM) images. The proposed Nanofiber Classifier model is trained on a dataset consisting of three categories: Slightly Defective, Defective, Non-DefectiveThis repository contains the source code and dataset necessary to replicate the results of the research paper:"Automated Defect Classification of Electrospun Polyacrylonitrile Nanofibers via Deep Learning of SEM Images"