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X-Ray Fluorescence and Reflectography Data from Berlin, Staatsbibliothek zu Berlin manuscript Ms. or. fol. 1212 (Erfurt 2)

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资源简介:
XRF (Elio: 40kV, 80 µA, spot measurements of 120s each) and  reflectography (DinoLite: x50 magnification for spots on ink and pigment, vis, NIR and UV light) analysis of inks from Ms. or. fol. 1212 (Erfurt 2). Erfurt2_reflectography.zip - complete reflectography Dataset Erfurt2_XRF.zip - complete XRF Dataset Report_Bibelhandschrift 1212.docx - detailed report
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Universität Hamburg
创建时间:
2022-07-13
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