Data supporting "On the extraction of yield stresses from micro-compression experiments"
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https://www.repository.cam.ac.uk/handle/1810/311243
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资源简介：
Raw data supporting the publication. Original SEM images of micropillar before and after compression as input for digital image correlation obtained using a FEI Helios Nanolab dual beam FIB/SEM. Drift and rig compliance corrected load-displacement data obtained using an Alemnis nanoindenter in combination with the software Micromechanics Analyser (EMPA).
提供机构：
Apollo - University of Cambridge Repository
创建时间：
2020-10-06
