Multi-Voltage PUF DataSet

This dataset contains Challenge-Response Pairs (CRPs) from Ring Oscillator-based Physical Unclonable Functions (RO-PUFs) operating under constant and variable voltage conditions. Collected from three chips fabricated in a 22nm FDSOI process and powered by a Switched-Capacitor DC-DC converter, it includes two sections: responses at a fixed voltage and across nine voltage levels (nominal and ±10% variations). Organized into ten folders, the dataset includes 1K CRPs per chip for each voltage and a combined folder with 20K CRPs. All data is stored in hexadecimal format, with a subset of concatenated 128-bit responses for further analysis. This dataset enables evaluation of voltage-aware hardware security primitives and supports research in PUF reliability and machine learning modeling.

本数据集包含来自基于环形振荡器的物理不可克隆函数（Ring Oscillator-based Physical Unclonable Functions，RO-PUFs）的挑战响应对（Challenge-Response Pairs，CRPs），这些函数在恒定与可变电压条件下运行。数据集采自3片采用22nm全耗尽绝缘体上硅（FDSOI）工艺制造、由开关电容型直流-直流转换器供电的芯片，包含两个数据板块：固定电压下的响应数据，以及覆盖9种电压等级（标称电压及±10%电压偏移）的响应数据。数据集以10个文件夹进行组织，每款芯片在每种电压条件下对应1000条CRPs，另有一个合并文件夹包含20000条CRPs。所有数据以十六进制格式存储，其中包含一组拼接而成的128位响应值子集，可用于后续分析。本数据集可用于评估感知电压的硬件安全原语，支持物理不可克隆函数可靠性与机器学习建模相关研究。

搜集汇总

背景与挑战

背景概述

Multi-Voltage PUF DataSet是一个专注于硬件安全的数据集，提供了在不同电压条件下RO-PUFs的挑战-响应对，适用于评估电压感知的硬件安全原语和研究PUF的可靠性及机器学习建模。数据集包含来自三个芯片的固定和可变电压响应数据，组织成十个文件夹，数据以十六进制格式存储，便于进一步分析。