Reliability Analysis of Random Telegraph Noisebased True Random Number Generators
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资源简介：
* Repository author: Tommaso Zanotti* email: tommaso.zanotti@unimore.it or francescomaria.puglisi@unimore.it * Version v1.0
This repository includes MATLAB files and datasets related to the IEEE IIRW 2023 conference proceeding:T. Zanotti et al., "Reliability Analysis of Random Telegraph Noisebased True Random Number Generators," 2023 IEEE International Integrated Reliability Workshop (IIRW), South Lake Tahoe, CA, USA, 2023, pp. 1-6, doi: 10.1109/IIRW59383.2023.10477697
The repository includes:
The data of the bitmaps reported in Fig. 4, i.e., the results of the simulation of the ideal RTN-based TRNG circuit for different reseeding strategies. To load and plot the data use the "plot_bitmaps.mat" file.
The result of the circuit simulations considering the EvolvingRTN from the HfO2 device shown in Fig. 7, for two Rgain values. Specifically, the data is contained in the following csv files:
"Sim_TRNG_Circuit_HfO2_3_20s_Vth_210m_no_Noise_Ibias_11n.csv" (lower Rgain)
"Sim_TRNG_Circuit_HfO2_3_20s_Vth_210m_no_Noise_Ibias_4_8n.csv" (higher Rgain)
The result of the circuit simulations considering the temporary RTN from the SiO2 device shown in Fig. 8. Specifically, the data is contained in the following csv files:
"Sim_TRNG_Circuit_SiO2_1c_300s_Vth_180m_Noise_Ibias_1.5n.csv" (ref. Rgain)
"Sim_TRNG_Circuit_SiO2_1c_100s_200s_Vth_180m_Noise_Ibias_1.575n.csv" (lower Rgain)
"Sim_TRNG_Circuit_SiO2_1c_100s_200s_Vth_180m_Noise_Ibias_1.425n.csv" (higher Rgain)
创建时间：
2024-09-30
