Temperature Dependent Lattice Parameters and Coefficient of Thermal Expansion for Tantalum Nitride
收藏DataCite Commons2025-03-26 更新2025-04-16 收录
下载链接：
https://dataverse.lib.virginia.edu/citation?persistentId=doi:10.18130/V3/BUWWQB
下载链接
链接失效反馈官方服务：
资源简介：
This dataset contains Rietveld refined lattice parameters for hexagonal tantalum nitride. The tantalum nitride powder was sourced from Thermo Scientific CAS 12033-62-4. X-Ray diffraction data was collected using a Malvern Panalytical Empyrean II X-Ray diffractometer with copper K-alpha radiation. High temperature X-ray diffraction measurements were collected from 313 to 928 K using an Anton Paar furnace under nitrogen ambient. Lattice parameters were extracted from sequential fitting using GSAS-II. Isotropic coefficient of thermal expansion values were calculated from the incremental volume change with temperature.
提供机构：
University of Virginia Dataverse
创建时间：
2024-08-22
