Data underlying the publication: Metastable Oxygen-Induced Light-Enhanced Doping in Mixed Sn-Pb Halide Perovskites

Data for SSMC and TRMC results, XRD, UV-Vis-NIR spectroscopy and XPS results in the main manuscript and Supporting Information published with DOI: 10.1021/jacs.4c08924.The raw data were collected in the years 2023-2024, using various structural, compositional, and opto-electronic characterization methods on solution-based spin-coated mixed tin-lead (Sn-Pb) perovskite thin films. All measurements were conducted at room temperature, after varying exposure to oxygen and/or light, or after rest in nitrogen, to study the metastable oxygen-induced light-enhanced doping in the layers. More specifically, all SSMC and TRMC measurements were conducted under nitrogen. The xy data obtained from X-ray diffraction (XRD), UV-Vis-NIR spectroscopy, and X-ray photoelectron spectroscopy (XPS) were imported into Igor Pro (Wavemetrics). In Igor Pro, these xy data are stored as "waves," corresponding to the values on the x and y axes in the plots. Data for Steady State Microwave Conductance (SSMC) and Time-Resolved Microwave Conductivity (TRMC) were collected directly as waves in Igor Pro on the computers connected to the respective microwave-based setups. Igor Pro was used to generate all data plots.For further information on file formats and naming, the units and abbreviations used for all measured values and labels, and instructions for opening or modifying Igor Pro files, please refer to the README.pdf included in the dataset. It is strongly recommended to consult the corresponding publication for guidance on the files in these datasets, as each file name includes a reference to its associated figure. The main manuscript and Supporting Information of the publication contains details about the characterization instruments and additional data processing specifics.

本数据集包含关联DOI为10.1021/jacs.4c08924的发表论文主文稿及补充材料中所涉及的稳态微波电导（Steady State Microwave Conductivity, SSMC）、时间分辨微波电导（Time-Resolved Microwave Conductivity, TRMC）结果、X射线衍射（X-ray diffraction, XRD）、紫外-可见-近红外（UV-Vis-NIR）光谱及X射线光电子能谱（X-ray photoelectron spectroscopy, XPS）相关数据。原始数据采集于2023至2024年，采用多种结构、组分及光电子学表征方法，对基于溶液旋涂的锡铅混合（Sn-Pb）钙钛矿薄膜开展测试。所有测试均在室温环境下进行，测试前样品分别经过不同时长的氧气和/或光照暴露，或在氮气环境中静置，以研究薄膜中亚稳态氧诱导的光增强掺杂效应。需特别说明的是，所有SSMC与TRMC测试均在氮气环境中完成。从XRD、UV-Vis-NIR光谱及XPS获取的xy轴数据均导入至Igor Pro（Wavemetrics公司）软件中，此类xy数据以“波（waves）”的形式存储，对应绘图中的x轴与y轴数值。SSMC与TRMC数据则直接通过连接对应微波测试装置的计算机，以waves形式在Igor Pro中采集得到。所有数据绘图均由Igor Pro生成。若需了解文件格式与命名规则、所有测量值及标签所使用的单位与缩写，以及打开或修改Igor Pro文件的操作指南，请参阅数据集中附带的README.pdf文件。强烈建议参考对应发表论文以指导本数据集文件的解读，因每个文件名均标注了其关联的图表编号。该论文的主文稿及补充材料中包含了表征仪器细节与额外数据处理的具体说明。