Supplement TABLE S1, Supplement FIG S1, Supplement FIG S2, Supplement FIG S3, Supplement FIG S4, Supplement Moive S1.,,

TABLE S1. Parameters used in coupled numerical analysis. FIG. S1. The finite element model of the DMCs. FIG. S2. Correlation between the EWOD force and the dielectric layer permittivity. FIG. S3. Correlation between EWOD force and the dielectric layer thickness (frequency = 102 Hz). FIG. S4. Simulation result. Movie S1: Droplet and particle driving experiments in digital microfluidic chips.

表 S1. 耦合数值分析中使用的参数。图 S1. 数字微流控芯片的有限元模型。图 S2. 电场操控力与电介质层介电常数之间的相关性。图 S3. 电场操控力与电介质层厚度之间的相关性（频率 = 102 Hz）。图 S4. 模拟结果。电影 S1：数字微流控芯片上的液滴和颗粒驱动实验。