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Direct spectroscopy of muon donor and acceptor levels in silicon carbide

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B2FIND2026-04-25 收录
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https://b2find.eudat.eu/dataset/8e34727c-60b8-5b14-880f-1e241f851468
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We will perform direct laser spectroscopy to measure the ionisation energy of muon defect levels in a semiconductor - specifically silicon carbide. We should see a broad...
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