Measurement Data - Total Ionizing Dose Effects on Variability in 40 nm Bulk CMOS Ring Oscillators
收藏DataCite Commons2025-12-22 更新2026-05-06 收录
下载链接：
https://repository.tugraz.at/doi/10.3217/01e7n-e9s18
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资源简介：
This repository contains experimental measurement data supporting the analysis presented in the associated IEEE Transactions on Nuclear Science publication. The dataset captures time-domain oscillation frequency measurements of CMOS ring oscillators fabricated in a commercial 40 nm bulk CMOS technology and exposed to X-ray Total Ionizing Dose (TID) irradiation up to 100 Mrad(SiO₂). The primary objective of the dataset is to enable a statistical investigation of circuit-to-circuit frequency variability as a function of radiation dose, supply voltage, and post-irradiation annealing.
提供机构：
Graz University of Technology
创建时间：
2025-12-22
