Determining Beam Usage Limits for Microelectronic Components
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资源简介：
The application objective is to evaluate the pulse intensity as a function of photon energy, the use of an attenuator system and the pulse duration on encapsulated and unencapsulated microelectronic components to systematize the beam parameters and evaluate their equivalence from a microelectronics point of view.
创建时间：
2028-01-01
