Determination of the magnetic structure in piezomagnetic Mn3SnN thin films using neutron diffraction

The family of manganese antiperovskites with the formula Mn3AN (A = Sn, Ni, Ga…) have recently attracted much attention due to the range of interesting properties they display due to geometric magnetic frustration, such as barocaloric and Invar effects, baromagnetism and temperature independent resistivity. We have recently experimentally determined a giant piezomagnetic effect (PME) in Mn3NiN thin films, which provides a novel method for control of magnetism via electric field in spintronics applications, with several advantages over current magnetostriction-based devices as complete reversal of the magnetisation can be achieved. A 4-fold larger PME is expected in Mn3SnN and here we propose to use WISH to determine the magnetic structure in Mn3SnN thin films. The results will guide the engineering of Mn3SnN thin films to optimise the PME for spintronics applications.