Data for: Information Depth in Backscattered Electron Microscopy of Nanoparticles Within a Solid Matrix
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This file contains:
Simulated line scans of the backscattered electron signals obtained from Monte Carlo simulations for different nanoparticle sizes, depth and accelerating voltages (used for Figure 4)
Experimental diameters measured from SEM and TEM micrographs
创建时间：
2018-02-09
