Comparison of average deviance per cell between shuffled point pattern sets and original point pattern sets. Lower average deviance per cell indicates a higher likelihood that a particular image could have been produced by a given model. The mean and standard deviation across the 100 shuffled patterns is shown on a log scale. The significantly higher deviances for the shuffled patterns and the original pattern demonstrate the non-random distribution of the cell types. How the extremely high deviances seen in some cases can be obtained is discussed in the Materials and methods.

Comparison of average deviance per cell between shuffled point pattern sets and original point pattern sets. Lower average deviance per cell indicates a higher likelihood that a particular image could have been produced by a given model. The mean and standard deviation across the 100 shuffled patterns is shown on a log scale. The significantly higher deviances for the shuffled patterns and the original pattern demonstrate the non-random distribution of the cell types. How the extremely high deviances seen in some cases can be obtained is discussed in the Materials and methods.