Single Event Burnout Investigation of Power Transistors
收藏DataCite Commons2021-05-06 更新2025-04-16 收录
下载链接：
https://data.isis.stfc.ac.uk/doi/INVESTIGATION/113857072/
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资源简介：
This investigation with give insight on the reliability for power transistors under high voltage stress in face of terrestrial cosmic radiation.
提供机构：
ISIS Facility
创建时间：
2021-05-06
