X-Ray Fluorescence and Reflectography Data from Berlin, Staatsbibliothek zu B...
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https://b2find.eudat.eu/dataset/b633ca41-0808-59df-9ad9-1607e8d3ce44
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资源简介：
XRF (Elio: 40kV, 80 µA, spot measurements of 120s each) and reflectography (DinoLite: x50 magnification for spots on ink and pigment, vis, NIR and UV light) analysis...
