Additional file 3 of Non-destructive, high-content analysis of wheat grain traits using X-ray micro computed tomography
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Additional file 3: Table S2. Dataset obtained for the same wheat spike scanned at different resolutions as indicated. No significant difference for p < 0.001 was found for traits measured either in the 68.8 µm/pixel or the 34.4 µm/pixel 3D reconstructed volumes.
创建时间：
2017-11-01
