Figure 3: Assembly formation and characterization with Helium Ion Microscopy (HIM), Atomic Force Microscopy (AFM), and Transmission Electron Microscopy (TEM)

<b>Figure 3: Assembly formation and characterization with Helium Ion Microscopy (HIM), Atomic Force Microscopy (AFM), and Transmission Electron Microscopy (TEM)</b>, all reveal fractal-like topologies on a surface, (<b>A to G</b>) Longer fractal-like structures, branch-like, and flower-like structures are seen in HIM (<b>A</b> to <b>C</b>) and AFM (<b>D</b>). (<b>E</b>) Representative HIM images for assemblies obtained at different concentrations of pY-AtzAM1 (250 nM- 3 µM) while maintaining a fixed concentration of AtzCM1-SH2 (2 µM). Increasing concentrations of pY-AtzM1 result in larger assemblies with higher fractal dimensions. (<b>F</b>) D_f and l, the fractal dimension and lacunarity of the images, are similar for images obtained from different microscopy techniques. HIM images show fractal-like assembly formation with pY-AtzAM1 and AtzCM1-SH2 (<b>G</b>), while the Gly-Ser-rich linker-containing variants form globular assemblies under these conditions (<b>H</b>).