Scanning electron microscopy data of plastic fragments sampled during the composting experiment

The surface properties, fragmentation and the microbial attachment to the surface were be observed in the scanning electron microscopy (SEM). SEM observations were performed using a Desktop SEM (Phenom ProX, Fondis Bioritech, France) with an acceleration voltage ranging between 5 and 10 kV secondary electrons. Samples were directly mounted on stub using carbon conductive tape and then coated with Gold/Palladium during 45 s at 20 mA (4 nm thick) by ion sputtering (Mini Sputter Coater SC7620, Quorum Technologies Ltd, UK).