相关数据集
Nanocrystalline Diamond
Nanocrystalline diamond film deposited on silicon wafer Substrate Manufacturer : Advanced Diamond Technologies, Inc.
DataCite Commons2022-03-25 更新440
BJP Inconel 625: Sintered at 1285C for 0.75 hours (Traditional Techniques)
Stylus Profilometry, 3D Microscopy, and Scanning White-Light Interferometry measurements were taken on an Inconel 625 sample, created with binder-jet printing, and sintered at 1285 C degrees for 0.75
DataCite Commons2025-03-17 更新120
Ni36.67Co30Fe16.67Ti16.67 20% engineering strain
This surface is the result of a Molecular Dynamics simulation of bi-axial compression of a single crystal Ni36.67Co30Fe16.67Ti16.67 solid solution. The initial configuration was a Ni36.67Co30Fe16.67Ti
DataCite Commons2022-03-25 更新90
Surface Topography Challenge (C27/C28)
Rough Surface Measured by Zygo NewView Size 8.6mm*8.6mm Sample ID: C27/C28
DataCite Commons2023-09-15 更新160
Rough surface - Sample ID P54
An XE-100 atomic force microscope (AFM, Park Systems) was used in contact mode with a NSC36C cantilever (Park Systems). The cantilever had a force constant of 0.6 N/m, resonant frequency of 65 kHz, le
DataCite Commons2024-10-23 更新100
