Data for 'Precise characterization of nanometer-scale systems using interferometric scattering microscopy and Bayesian analysis'
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下载链接：
https://doi.org/10.7910/DVN/N7GJYC
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资源简介：
Data analyzed in "Precise characterization of nanometer-scale systems using interferometric scattering microscopy and Bayesian analysis." See text and supplemental materials for more information.
创建时间：
2023-08-26
