Structure evolution of V2O5 thin films deposited on quartz glass substrate - High-Temperature X-ray Diffraction

The DataSet contains the XRD patterns of  V2O5 thin films deposited on guartz glass. The thin films were obtained by the sol-gel method.  The information about sol synthesis is described in the Journal of Nanomaterials. The sol was deposited on the quartz glass substrate. The structure was measured in-situ during heating between 50-800°C  under synthetic air. 
X-ray diffraction patterns (XRD) were collected on a Philips X’PERT PLUS diffractometer with Cu Ka radiation (1.5406 Å) and ranging from 10 to 80 degrees.