Tomography Data for: Three-dimensional Nanoscale Metal, Metal Oxide and Semiconductor Frameworks through DNA-programmable Assembly and Templating

This is data collected at the 3-ID Hard X-ray Nanoprobe beamline. This repository supports the following research article: Data provided is the aligned dataset and reconstruction using a FISTA algorithm. Angles Collected -90 to +45 at 1 degree steps. Three-dimensional Nanoscale Metal, Metal Oxide and Semiconductor Frameworks through DNA-programmable Assembly and Templating By Aaron Michelson.