X-ray Diffraction and Atomic Force Microscopy of RuO2 thin films
收藏Mendeley Data2024-01-31 更新2024-06-28 收录
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https://hdl.handle.net/11299/234208
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X-ray Diffraction data of the RuO2 samples were obtained to assess the crystallinity and epitaxial nature of the thin films grown on different substrates. Atomic Force Microscopy was used to determine the surface morphology changes as a function of thickness and epitaxial strain and correlate it with the observed oxygen evolution activity.
创建时间：
2024-01-31
