XRD patterns of VO2 and V2O3 thin films obtained at 700°C
收藏DataCite Commons2026-04-27 更新2025-04-16 收录
下载链接：
https://mostwiedzy.pl/en/open-research-data/xrd-patterns-of-vo2-and-v2o3-thin-films-obtained-at-700degc,70603040777819-0
下载链接
链接失效反馈官方服务：
资源简介：
The DataSet contains the XRD patterns of VO2 and V2O3 thin films obtained by the sol-gel method. The information about sol synthesis is described in the Journal of Nanomaterials. The thin films with different thicknesses (5-9 AsP layers) were deposited on a silicon substrate and were annealing at 700°C under an argon atmosphere.
X-ray diffraction patterns (XRD) were collected on a Philips X’PERT PLUS diffractometer with Cu Ka radiation (1.5406 Å) and ranging from 10 to 80 degrees.
提供机构：
Gdańsk University of Technology
创建时间：
2021-07-06
