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Atomic force microscopy of transfer film development

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Atomic force microscopy (AFM) provides the opportunity to perform fundamental and mechanistic observations of complex, dynamic, and transient systems and ultimately link material microstructure and its evolution during tribological interactions. This investigation focuses on the evolution of a dynamic fluoropolymer tribofilm formed during sliding of polytetrafluoroethylene (PTFE) mixed with 5 wt% alpha-phase alumina particles against 304L stainless steel. Sliding was periodically interrupted for AFM topography scans. The average film roughness, the average friction coefficient, and polymer wear rate based on sample height recession were recorded as a function of increasing sliding cycles. Topographical maps suggest tribofilm nucleates in grooves of the steel counter sample, spreads and develops into a uniform film through sliding. Prominent nanoscale features were visible around 10,000 sliding cycles and thereafter. Scanning electron microscopy and energy-dispersive X-ray spectroscopy s..., , , # Atomic force microscopy of transfer film development [https://doi.org/10.5061/dryad.zpc866thd](https://doi.org/10.5061/dryad.zpc866thd) Corresponding Author: Angela A. Pitenis [apitenis@ucsb.edu](mailto:apitenis@ucsb.edu) File List A) AFM_Region_1.zip B) AFM_Region_2.zip C) AFM_Region_3.zip D) AFM_Region_4.zip E) Countersurface.zip F) Fig3_AverageRoughness.csv G) Fig3_FrictionAndWear.csv H) Fig5_Al.tif I) Fig5_SI.tif J) Fig6.csv K) FigS1_0s.tif L) FigS1_5s.tif M) FigS1_10s.tif N) FigS2_10k.tif O) FigS2_20k.tif P) FigS2_30k.tif Q) FigS2_40k.tif R) FigS2_50k.tif S) FigS2_100k.tif T) FigS2_all.jpg U) FigS3.csv V) FigS4_10k.ibw W) FigS4_20k.ibw X) FigS4_30k.ibw Y) FigS4_40k.ibw Z) FigS4_50k.ibw AA) FigS4_100k.ibw AB) FigS5.csv ## Figures 1, 2, 4, SV1: AFM Data A) AFM_Region_1.zip: zip folder containing IBW files for each AFM scan done in region 1 on the primary sample. These files are labeled Region1_Cycle_X, where X is the cycle number the AFM scan was ta...
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2024-07-20
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