The calculation dataset of Figure.2 in the titled journal paper: Quantifying Flat-Band Voltage in Si Metal-Oxide-Semiconductor Structures- An Evaluation via Terahertz Emission Spectroscopy (TES)
The calculation dataset of Figure.2 in the titled journal paper: Quantifying Flat-Band Voltage in Si Metal-Oxide-Semiconductor Structures- An Evaluation via Terahertz Emission Spectroscopy (TES)