Figure and the corresponding supplementary video for this article

Samples for microscopic examination were prepared by wire electrical discharge machining along the vertical YOZ plane at the midsection of the BLC test specimen. The energy dispersive spectroscopy (EDS) was performed using a scanning electron microscope (SEM, Sigma HD) to investigate the phase composition and elemental distribution within the interface region and TB layer. Prior to the electron back scatter diffraction (EBSD, SM-7900F) examination, the sample underwent electrochemical polishing for 20 s at an applied voltage of 30 V, utilizing a solution composed of 700 ml of 95 % ethanol and 300 ml of 30 % perchloric acid. EBSD maps generated at a scanning step of 2μm. The acquired experimental data were processed utilizing the HKL Channel5 software. The transmission electron microscope (TEM, FEI Talos F200X) specimens were mechanically ground to a thickness of approximately 50 μm and subsequently electropolished in a solution containing 37 vol% nitric acid and 63 vol% methanol. This process was performed at a temperature of 256 K with an applied current of 13 A. The scanning parameters for X-ray computed tomography (XCT, AL225-01MA) test were set as follows: the voltage was 70 kV, the current was 200 μA, the focus-to-detector distance was 700 mm, and the focus-to-object distance was 15 mm. A more comprehensive visualization of the deposition process is available in Supplementary Videos 1-3.