(Table 2) Composition of native Cu occurrences from two samples of DSDP Hole 22-216 and 92-597C
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Average concentrations for point measurements under the assumption that the Cu**0 particles are homogeneous in depth and themain additional elements in the surface films are O and Cl (see the RBS data). It should be noted that the samples are inhomogeneous and therefore these results contain systematic deviations
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2025-11-21
