Associated dataset for 'Barrier–channel intermixing and 2-dimensional electron gas degradation in Al-rich Al(Ga)N/AlGaN high electron mobility transistor heterostructures'

This dataset contains the raw experimental and simulation data used to generate the figures in the associated manuscript: "Barrier-channel intermixing and two-dimensional electron gas degradation in Al-rich Al(Ga)N/AlGaN high-electron-mobility transistor heterostructures". File descriptions and the mapping between data files and manuscript figures are provided in `summary.csv`. Additional sample information, including growth conditions, is provided in `sample_metadata.csv`. Further details are available in the README file.