Non-destructive thickness mapping of wafer-scale hexagonal boron nitride down to a monolayer
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https://zenodo.org/record/1312843
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资源简介：
Raw data associated with the publication "Non-Destructive Thickness Mapping of Wafer-Scale Hexagonal Boron Nitride
Down to a Monolayer" published in ACS Applied Materials & Interfaces under the DOI: 10.1021/acsami.8b08609
创建时间：
2024-08-02
