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The goal for this program is to monitor the degradation of the Charge Transfer Efficiency (CTE) and the efficacy of using post-flash mode over time. These are monitored using a series of WFC3-UVIS darks with NO post-flash taken before and after the monthly UVIS anneal. There is another program that collects post-flashed darks to monitor the hot-warm pixel growth and median dark current of the detector comma and so this is a supplementary program to that one comma to compare un-flashed internals to these post-flashed ones. When used in conjunction with the post-flashed internals comma the un-flashed internals allow for an assessment of how well the post-flash is mitigating the CTE losses. The products generated from this program include on-going analysis of the post-flash efficacy and an updated report on the CTE degradation over time. This is usually in the form of an ISR. Prior result is WFC3 ISR 2019-10doublePoint Post-flashed superdarks contain at least 50% more hot pixels comma and had 2 e--hr lower dark current for each anneal cycle