Supporting information
收藏DataCite Commons2024-05-22 更新2024-08-18 收录
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https://aip.figshare.com/articles/dataset/Supporting_information/25743183/1
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资源简介：
Details on the method employed to determine film thickness from XPS measurements; the cluster models used for the IR peak assignment by DFT calculations; images showing the δNH2 vibration for aniline adsorbed in the horizontal and vertical configuration; N content on the Ru non-growth area after aniline adsorption at various temperatures measured by XPS.
提供机构：
AIP Publishing
创建时间：
2024-05-22
